The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2000
Filed:
Aug. 03, 1998
Paul David Gast, Camas, WA (US);
Mark S Hickman, Vancouver, WA (US);
David H Donovan, Barcelona, ES;
Xavier Gros, Barcelona, ES;
Antoni Gil Miquel, Barcelona, ES;
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
In various methods, image registration variations among test patterns are used to calibrate misalignment among one or more printheads, paper advance distance, different portions of an inkjet printhead, or bidirectional printhead alignment. A set of test patterns are printed. Each pattern includes a reference portion and a varying portion. The varying portion is changed from pattern to pattern in a manner for testing a parameter being calibrated. An optical sensor scans each test pattern. The parameter setting for the lest pattern having the highest reflectance (i.e., most blank space) is selected as the calibrated parameter value.