The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2000
Filed:
Mar. 09, 1998
Applicant:
Inventor:
Michio Komoda, Hyogo, JP;
Assignee:
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
714727 ;
Abstract
A test circuit for DC testing which has a simple layout design and never causes malfunction due to simultaneous change of outputs includes test circuits connected to inputs of output allowable buffers. The test circuits are connected in a circle so that a value retained in each circuit can be applied to the adjacent test circuit. In the DC testing using the test circuit for DC testing, values which are retained in and output from output allowable buffers are circulated between the output allowable buffers. At the time, the values retained in the test circuit are changed within the range of the number allowable for simultaneous change.