The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2000

Filed:

Mar. 28, 1997
Applicant:
Inventors:

Jeffrey Lubin, So. Orange, NJ (US);

Heidi A Peterson, New York, NY (US);

Clay D Spence, Princeton Junction, NJ (US);

Aalbert de Vries, Lawrenceville, NJ (US);

Assignee:

Sarnoff Corporation, Princeton, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ; G06T / ;
U.S. Cl.
CPC ...
382156 ; 382239 ;
Abstract

A signal processing apparatus and concomitant method for learning and using fidelity metric as a control mechanism and to process large quantities of fidelity metrics from a visual discrimination measure (VDM) to a manageable subjective image quality ratings. The signal processing apparatus incorporates a VDM and a neural network. The VDM receives input image sequences and generates fidelity metrics, which are received by a neural network. The neural network is trained to learn and use the fidelity metrics as a control mechanism, e.g., to control a video encoder.


Find Patent Forward Citations

Loading…