The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2000
Filed:
Nov. 12, 1996
Howard Stern, Greenlawn, NY (US);
Fereydoun Maali, New York, NY (US);
Robotic Vision Systems, Inc., Hauppauge, NY (US);
Abstract
A system for simultaneously obtaining a plurality of images of an object or pattern from a plurality of different viewpoints is provided. Proper image contrast is obtained by replacing the light sources of earlier systems with equivalent light sensitive devices and replacing the cameras of earlier systems with equivalent light sources. Bright-field and dark-field images may be simultaneously obtained. In another aspect, a light source is positioned to illuminate at least some of an object. A plurality of light guides are positioned to simultaneously receive light reflected from the object and transmit it to a plurality of photodetectors. The light guides are arranged so their respective input ends are spaced substantially equally along at least a portion of a surface of an imaginary hemisphere surrounding the object. The signals from the photodetectors are processed and a plurality of images are formed. Another aspect provides generating composite images from simultaneously obtained images. Equivalent regions of each image geographically identical subpictures) are compared. The subpicture having the highest entropy is selected and stored. This process continues for all subpictures. A new composite picture is generated by combining the selected subpictures. In another aspect, the vector of relative light values gathered for each pixel or region of an object illuminated or scanned is used to determine reflectance properties of points or regions illuminated on the object or pattern. The reflectance properties may be stored in a matrix and the matrix used to read, for example, a Bar Code of a data matrix symbol.