The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2000
Filed:
Nov. 28, 1997
Hiroyuki Yoshida, Chicago, IL (US);
Wei Zhang, Mountain View, CA (US);
Robert M Nishikawa, Batavia, IL (US);
Kunio Doi, Willowbrook, IL (US);
Arch Development Corporation, Chicago, IL (US);
Abstract
A computer-aided diagnosis (CAD) method for detection of clustered microcalcifications in digital mammograms based on an image reconstruction using a substantially optimally weighted wavelet transform. Weights at individual scales of the wavelet transform are optimized based on a supervised learning method. In the learning method, an error function represents a difference between a desired output and a reconstructed image obtained from weighted wavelet coefficients of the wavelet transform for a given mammogram. The error function is then minimized by modifying the weights by means of a conjugate gradient algorithm. Performance of the optimally weighted wavelets was evaluated by means of receiver-operating characteristic (ROC) analysis which indicated that the present invention outperformed both a difference-image technique and partial reconstruction method currently used in CAD methods.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile