The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2000

Filed:

Aug. 25, 1998
Applicant:
Inventors:

Kishore Acharya, Brookfield, WI (US);

Diane M Miesbauer, Brookfield, WI (US);

Shibu P Pillai, Waukesha, WI (US);

Charles Shaughnessy, Whitefish Bay, WI (US);

Assignee:

General Electric Company, Milwaukee, WI (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
378-4 ; 378 19 ; 378901 ;
Abstract

The present invention, in one form, is an imaging system which, in one embodiment, utilizes scan data and DAS input signals to determine image quality. More specifically, and in one embodiment, by generating a ratio of data from two scans, a group of non-conforming detector cells may be identified. In addition, by comparing scans performed at different time frames, a trend of image quality is also determined. In addition, a group of non-conforming DAS channels may be identified by applying a range of known input signals. By comparing the an absolute gain ratio, the DAS performance is determined.


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