The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2000

Filed:

Jan. 30, 1998
Applicant:
Inventors:

David M Braun, Santa Rosa, CA (US);

Timothy L Bagwell, Rohnert Park, CA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ; G01N / ;
U.S. Cl.
CPC ...
359578 ; 359484 ; 359487 ; 359495 ; 359497 ; 356416 ;
Abstract

An optical spectrum analyzer includes a polarization modifier that eliminates polarization-dependent wavelength spreading, enabling the analyzer to have high signal selectivity and high measurement sensitivity. The polarization modifier spatially separates orthogonal polarization components of the applied optical signal into separate optical beams and rotates the relative polarization components of the beams so that the beams are incident on a tunable interference filter in a multipass configuration at a single polarization state. The optical beams are directed through regions of the interference filter which lie on a contour of substantially equal center wavelength so that each of the multiple passes through the interference filter provides for corresponding narrowing of the filter bandwidth. Narrow bandwidth and low insertion loss are maintained over a wide tuning range by tilting the interference filter about a tilt axis intercepting the regions of the interference filter that lie on a contour of substantially equal optical thickness.


Find Patent Forward Citations

Braun, David. (2000). Optical spectrum analyzer having tunable interference filter (U.S. Patent No. 6075647). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6075647

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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