The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2000
Filed:
Nov. 26, 1997
David M Braun, Santa Rosa, CA (US);
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
An optical noise monitor measures noise power within narrow wavelength regions between channel signals of a dense wavelength division multiplexed (DWDM) signal. The noise monitor receives the DWDM signal and cascades the signal along a multipoint travel path where the signal is incident on a series of multi-pass filters. Each multi-pass filter selects a narrow, predefined wavelength region between channel signals of the DWDM signal. Noise power within the predefined wavelength region is detected and SNR is monitored by comparing the detected noise power to the power in the channel signal. According to a first preferred embodiment of the present invention, the noise monitor includes multi-pass filters that each have reflective surfaces to guide optical energy within a predefined wavelength region through multiple passes of an optical filter. According to a second preferred embodiment of the present invention, the noise monitor includes multi-pass filters each having a serial arrangement of multiple optical filters.