The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2000
Filed:
Mar. 27, 1997
Applicant:
Inventors:
Takayuki Nabeshima, Kokubunji, JP;
Minoru Sakairi, Tokorozawa, JP;
Yasuaki Takada, Kokubunji, JP;
Yukiko Hirabayashi, Kokubunji, JP;
Hideaki Koizumi, Tokyo, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01D / ; H01J / ;
U.S. Cl.
CPC ...
250292 ; 250281 ;
Abstract
A mass spectrometer in which, in order to reduce noise due to other particles (large charge droplets, neutral particles, photons, or the like), the orbit of ions and the orbit of other particles are separated from each other in the inside of a mass analysis region so as to make it possible to prevent the other particles from reaching an ion detection region without using any deflector.