The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2000

Filed:

Nov. 17, 1994
Applicant:
Inventors:

Vadlamannati Venkateswar, Dallas, TX (US);

Vivek Kumar Thakur, Karnataka, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
430 30 ; 345149 ; 345 89 ; 345 90 ; 347240 ; 382264 ; 382275 ;
Abstract

A method for defect-correction printing. A spatial light modulator that is used to generate the image is mapped for defects. The ON defects are compensated by setting a background level that is equal to the cumulative exposure of the ON defects, and then this background level becomes the threshold for development by the electrophotographic process. The system compensates for OFF defects by allocating the bits and exposures necessary to approximate the OFF defects to operative elements, thereby keeping the cumulative exposure for that pixel in the final printed image exactly, or as closely as possible, equal to the desired exposure. The corrections are contained in a defect correction module (10) that generates the appropriate patterns with the correct allocations to minimize error.


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