The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2000

Filed:

Feb. 16, 1999
Applicant:
Inventors:

Wen-Tung Chang, Hsinchu, TW;

Chao-Hsi Chung, Hsinchu Hsien, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B / ;
U.S. Cl.
CPC ...
451391 ; 451405 ;
Abstract

An apparatus for preparing an ultra-thin specimen with a polishing wheel is developed. The apparatus includes a base, a holding unit mounted on the base and having a movable part for supporting the specimen, and an adjusting assembly attached to the base for adjusting an orientation of the specimen relative to a top surface of the polishing wheel by providing a fine movement during polishing. The movable part of the holding unit is advantageously moved away from the adjusting assembly to enlarge the latitudinal cross-section of the apparatus so as to increase the precision of the orientation.


Find Patent Forward Citations

Chang, Wen-Tung. (2000). Apparatus for preparing ultra-thin specimen (U.S. Patent No. 6074291). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6074291

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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