The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2000
Filed:
Dec. 19, 1997
Gregory Michael Nordstrom, Oronoco, MN (US);
Shawn Michael Lambeth, Pine Island, MN (US);
Paul Edward Movall, Rochester, MN (US);
Daniel Frank Moertl, Rochester, MN (US);
Charles Scott Graham, Rochester, MN (US);
Paul John Johnsen, Rochester, MN (US);
Thomas Rembert Sand, Rochester, MN (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An apparatus, system and method permitting a variety of reset procedures and corresponding reset states. A device reset control register is provided for each I/O device adapter in single function or multifunction devices. The device reset control registers permit a greater degree of control over single function devices, multifunction device as a whole and individual device functions within a multifunction device. A device immediate status register synchronizes the various reset procedures. A logical power on reset procedure, a directed unit reset procedure and a directed interface reset procedure utilize the greater degree of control that the device reset control registers provide to force the I/O device adapter, single function device or multifunction device into a corresponding logical power on reset state, a directed unit reset state or a directed interface reset state. Each of these reset states is well-defined and has the advantage of predictable behavior during and after execution of the corresponding reset procedure. A built-in self-test procedure is also defined that sequentially examines each function associated within a multifunction device connected to the local bus to coordinate the initiation, execution and completion of built in self-tests.