The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2000
Filed:
Oct. 22, 1997
Michelle Baker, New York, NY (US);
Thomas A Ryan, State College, PA (US);
Other;
Abstract
Systems and methods for detecting changes, and in particular faults, in a changing environment include constructing a profile of the environment using observations made during no fault conditions. A range of values for one or more 'trusted' variables are identified as values indicative of a no fault condition. Data is also collected (only at times when the trusted variable(s) indicate(s) no fault) for other variables which may be indicative of a fault condition. Statistical profiles are established for each of these other variables. The environment is continuously monitored and the normal profile, as well as the thresholds/ranges, are preferably continuously updated during normal conditions, as indicated by the trusted variable(s). When, during monitoring of the environment, the trusted variable(s) exhibit value(s) outside the normal range, a possible fault condition is indicated and the present values of the other variables are examined to determine whether or not any of these variables exhibit values outside the normal profiled thresholds/ranges. Depending on which of these variables exhibits an abnormal value, a diagnosis of the fault may be possible. A method for determining the accuracy of trusted and fault variables is also disclosed.