The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2000

Filed:

Feb. 05, 1997
Applicant:
Inventor:

Toru Takamichi, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
370242 ; 370395 ; 370235 ;
Abstract

There is provided a fault self-supervising system of cell processor to execute fault supervising for internal circuit in the cell processor during the in-service period while the ordinary operation of the cell processor is kept without giving any influence on the main signal cell flow in the cell processor of the ATM network. In the structure of the fault self-supervising system of cell processor, the cell such as control cell or idle cell in the ATM cell flow which is not processed in the cell processor is overwritten by the supervising cell having a combination of VPI and VCI which is not used in the cell process and it is then applied in the preceding stage of the arithmetic circuit as the supervising object an is then transferred within the arithmetic circuit, the supervising information signal CHK indicating the operating condition of the arithmetic circuit obtained as a result of the transfer is compared and collated with the expected value E, a defective circuit of arithmetic circuit is detected from matching/mismatching as a result of comparison and the supervising cell is extracted in the subsequent stage of the arithmetic circuit.


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