The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2000
Filed:
Dec. 11, 1998
Nobuaki Kitajima, Tokyo, JP;
Kazuyuki Okamura, Tokyo, JP;
Kabushiki Kaisha, Topcon, Tokyo, JP;
Abstract
A slit lamp microscope of the present invention is provided in which it is possible to observe and record a clear image of the lesion portion of the eye to be examined with a high contrast, and at the same time, it is possible to observe and record the peripheral portion of the eye to be examined. The slit lamp microscope has a first illumination system for projecting local illumination light to the eye to be examined for observing a cross section of the observation portion. A second illumination system is provided with a diaphragm for limiting the illumination filed of the illumination light projected to the eye, for illuminating a peripheral portion of the illumination field of the eye projected by the first illumination system. This makes it possible to observe that the cross section and peripheral portion of the observation portion.