The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2000
Filed:
Feb. 19, 1998
Yuejian Wu, Kanata, CA;
Sanjay Gupta, Nepean, CA;
Nortel Networks Corporation, Montreal, CA;
Abstract
A method for and apparatus of testing a multi-port RAM (random access memory) detect single port faults and inter port shorts in multi-port random access memories. The algorithm performs a conventional single-port test such as MARCH or SMARCH on one port of the memory and performs an inter-port test on all other ports. The algorithm does not impose any extra test time and requires the addition of only a few gates to a conventional single-port BIST controller, independently of the size of the memory. An address to select ports of the multi-port RAM includes a row address signal of a plurality of bits. A specific bit of the row address signal is changed.