The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2000
Filed:
Apr. 09, 1997
Bernard Descales, Marseilles, FR;
Didier Lambert, Saint-Mitre-les-Remparts, FR;
Jean-Richard Llinas, Marseille, FR;
Andre Martens, Chateauneuf les Martigues, FR;
Sebastien Osta, Istres, FR;
Michel Sanchez, Lavera, FR;
Sylvie Bages, Lavera, FR;
Eutech Engineering Solutions Limited, Cheshire, GB;
Abstract
A method of determining or predicting a value P.sub.x of a property (e.g. octane number) of a material X or a property of a product of a process from the material or yield of the process for example a blending, separation, or chemical (e.g. polymerization) process, which method comprises measuring the absorption D.sub.ix of the material at more than one wavelength in the region 600-2600 nm, comparing the the signals indicative of the absorptions or a derivative thereof with signals indicative of absorptions D.sub.im or derivatives thereof at the same wavelength for a number of standards S in a bank for which the property or yield P is known, and choosing from the bank at least one standard S.sub.m with property P.sub.m the standard having the smallest average value of the absolute difference at each wavelength i between the signal for the material and the signal for the standard S.sub.m to obtain P.sub.x, with averaging of the properties or yields P.sub.m when more than one standard S.sub.m is chosen. If desired the method can be used as such to control the process by comparison of P.sub.m with the desired value and adjustment of the process to minimize deviations from P.sub.m ; in an alternative process the signal (or function thereof) of the standard(s) with the smallest average value of the absolute difference may be used directly to control the process.