The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2000

Filed:

Dec. 29, 1997
Applicant:
Inventors:

John W Sadler, Belmont, CA (US);

Dorsel N Andreas, Menlo Park, CA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ; G06K / ; G06K / ; H04N / ;
U.S. Cl.
CPC ...
382321 ; 382183 ; 382275 ; 382312 ; 235462 ; 358474 ;
Abstract

A method and apparatus for producing a set of compensated commands for a spot position mechanism. A dimensioned grating is placed across the beam path and an image of the grating is generated. The image is analyzed and the pixel position of the grating edges is compiled. From this a list of grating edge distances is produced and used to generate observed edge positions. A line is fit and removed from the list to produce a list of observed errors. The observed errors are correlated to the proper position space and a set of positions errors is produced. The position errors are subtracted from the command positions to produce a set of correction positions. This set of corrected positions can be used to command the spot position mechanism. The positions might also be tabulated and referenced. Interpolation between the points can also be performed.


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