The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2000
Filed:
Aug. 03, 1998
Gea-ok Cho, Suwon, KR;
Chun-sup Kim, Suwon, KR;
Samsung Electronics Co., Ltd., Kyungki-do, KR;
Abstract
A data slicer which effectively compensates for wobble and asymmetrical phenomena due to optical and electrical characteristics of a disk. The data slicer includes a comparator for outputting a pulse signal by comparing an RF signal detected by an pickup device with a slice reference value, a low pass filter for low-pass-filtering the pulse signal output from the comparator, a first differential amplifier for detecting the difference between the output of the low pass filter and a predetermined reference value (Vref), and providing the detected difference as the slice reference value of the comparator, a peak detector for detecting a peak value of the RF signal, a bottom detector for detecting a bottom value of the RF signal, and an average value detection portion for detecting an average value of the peak value detected by the peak detector and the bottom value detected by the bottom detector, and adding the detected value to the slice reference value of the comparator. Thus, an intermediate value of the RF signal is accurately detected by the peak detector, the bottom detector, and the average value detection portion, and the detected value is used as a slice level value. Thus, loss of data can be minimized.