The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2000

Filed:

Apr. 08, 1998
Applicant:
Inventors:

Dimitrios G Cecil, Bloomfield Hills, MI (US);

John E Nemazi, Bloomfield Hills, MI (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23Q / ;
U.S. Cl.
CPC ...
2940701 ; 2940708 ; 29709 ; 29716 ; 29798 ;
Abstract

A clinching station for securing a first workpiece to a second workpiece includes control logic receiving a punch position sensor output and processing the punch position sensor output and an established position signature to generate a clinching operation status signal. The clinching station includes a punch and die assembly including a punch and a die mounted opposite each other for movement relative to each other along a working axis. A position sensor is configured to monitor the position of the punch relative to the die, and has an output indicative of the position of the punch relative to the die. The established position signature corresponds to an acceptable clinching operation, and allows the control logic to generate the clinching operation status signal.


Find Patent Forward Citations

Cecil, Dimitrios. (2000). Quality control system for a clinching station (U.S. Patent No. 6067696). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6067696

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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