The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2000

Filed:

Aug. 15, 1997
Applicant:
Inventors:

William E Ortyn, Devall, WA (US);

Louis R Piloco, Kent, WA (US);

Jon W Hayenga, Kent, WA (US);

Assignee:

TriPath Imaging, Inc., Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382128 ; 250205 ;
Abstract

A method for checking cytological system illumination including the steps of checking global illumination variation, static field uniformity, dynamic field uniformity, specimen thickness variation, strobe repeatability, calibration plate cleanliness, and strobe dropout. A calibration plate and test target is employed for various illumination checks.


Find Patent Forward Citations

Ortyn, William. (2000). Cytological system illumination integrity checking apparatus and method (U.S. Patent No. 6067370). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6067370

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…