The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2000
Filed:
Dec. 15, 1998
Josef Beller, Hildrizhausen, DE;
Peter Thoma, Rottenberg, DE;
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
Disclosed is a system for determining wavelength dependent information, preferably event loss, reflectance, center wavelength, cross talk, directivity, and/or isolation, about an optical component in an optical structure. The system includes at least one light emitting source for providing light signals at a plurality of different wavelengths to an optical link which is in an optical connection with the optical component, a measuring unit for measuring a backscattered and/or reflected signal versus time returning from the optical structure, and a processing unit for determining the wavelength dependent information about the optical component by processing the measured signal versus time as measured for a plurality of light signals at different wavelengths. A particularly advantageous application of the invention is to determine the wavelength dependent spatial structure of an optical network. In that case, the wavelength dependent information is associated with spatial information representing spatial properties of the optical component.