The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2000
Filed:
Jan. 16, 1998
Akira Shirahama, Kanagawa, JP;
Shinichiro Miyazaki, Kanagawa, JP;
Takeshi Ohno, Saitama, JP;
Nobuo Ueki, Chiba, JP;
Sony Corporation, Tokyo, JP;
Abstract
When an image size is changed by using a linear interpolating process, a picture quality is improved so as not to overlap the position of an original signal and the position of an interpolation signal. An interpolation interval Vdp which is derived from an original image and an image size after the conversion is stored into a register of an input side and is accumulated and added by an adder from a register of an output side through a selector. A predetermined calculation is performed and an offset value q.sub.0 is obtained in a circuit. The value q.sub.0 is selected by the selector and the register of the output side is initialized for a vertical blanking period. Thus, a value (.delta.+nVdp) in which the value q.sub.0 was added to the accumulation value of Vdp is derived. On the basis of the value (.delta.+nVdp), a read address (n) of the original image and linear interpolation coefficients q.sub.n1 and q.sub.n2 are obtained. A similar process is also executed for the horizonal direction and an address (m) and coefficients p.sub.n1 and p.sub.n2 are obtained. A proper offset value is added to the interpolating position and the picture quality can be improved without overlapping the original signal and the interpolating position.