The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2000

Filed:

Oct. 24, 1996
Applicant:
Inventors:

Kyoichi Omata, Tanashi, JP;

Manabu Kiri, Machida, JP;

Toshiki Miyano, Yokohama, JP;

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B / ;
U.S. Cl.
CPC ...
348345 ; 348347 ; 348354 ;
Abstract

A method obtains an electrical signal from the photoelectric detector, which signal corresponds to the illumination of the image formed by the focusing lens. The image screen is divided into a plurality of subdivision areas. The method then calculates for the respective subdivision areas a focus evaluation value representative of a high frequency component contained in the electrical signal and a brightness value representative of a brightness of the image. The subdivision areas are sorted in accordance with a object distance classification. The method weights with different weights the subdivision areas on the basis of the subdivision area to which a main object belongs. Variations in the focus evaluation and brightness values are calculated by comparing the values after a focus and the values for an in-focus image. Compositional changes are detected based on the weights and the variation in the focus evaluation and brightness values.


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