The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2000

Filed:

Apr. 06, 1998
Applicant:
Inventors:

Joel P Dunsmore, Sebastopol, CA (US);

Michael S Marzalek, Bodega Bay, CA (US);

Susan Wood, Santa Rosa, CA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ; G01N / ;
U.S. Cl.
CPC ...
714 37 ; 356 731 ;
Abstract

A network analyzer measurement method adaptively adjusts measurement parameters of the network analyzer, based on a set of measurements of a device under test (DUT) and according to a user-specified limit contour, maximum permissible measurement error or other decision criteria. Measurement speed of the network analyzer is optimized by performing subsequent measurements on the DUT using the adjusted measurement parameters. Measurement bandwidth, the number of measurement sweeps or the frequency location of stimulus points of the analyzer is optimized when characterizing the DUT.


Find Patent Forward Citations

Dunsmore, Joel. (2000). Network analyzer measurement method using adaptive signal processing (U.S. Patent No. 6065137). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6065137

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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