The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2000
Filed:
Sep. 19, 1997
Satoshi Takahashi, Kanagawa-ken, JP;
Shigeki Sagayama, Tokyo, JP;
Nippon Telegraph and Telephone Corporation, Tokyo, JP;
Abstract
A pattern recognition scheme using probabilistic models that are capable of reducing a calculation cost for the output probability while improving a recognition performance even when a number of mixture component distributions of respective states is small, by arranging distributions with low calculation cost and high expressive power as the mixture component distribution. In this pattern recognition scheme, a probability of each probabilistic model expressing features of each recognition category with respect to each input feature vector derived from each input signal is calculated, where the probabilistic model represents a feature parameter subspace in which feature vectors of each recognition category exist and the feature parameter subspace is expressed by using mixture distributions of one-dimensional discrete distributions with arbitrary distribution shapes which are arranged in respective dimensions. Then, a recognition category expressed by a probabilistic model with a highest probability among a plurality of probabilistic models is outputted as a recognition result.