The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2000

Filed:

Jun. 30, 1997
Applicant:
Inventors:

Hazem M Hajj, Hillsboro, OR (US);

Roland T Chin, Clear Water Bay, HK;

Truong Q Nguyen, Burlington, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ; G06K / ; G06K / ; G06F / ;
U.S. Cl.
CPC ...
382195 ; 382190 ; 382260 ; 382278 ; 3647242 ; 36472803 ;
Abstract

A detector system locates a feature in an input signal. The input signal is applied to a multiscale filter bank which produces a corresponding set of filtered signals that are applied to a multiscale detector. A scale space tree table is produced by the detector which indicates the location in each filtered signal where the feature is possibly located. A MAP correlator examines the scale space tree table to determine which indications therein are feature locations. One-dimensional and two-dimensional embodiments are described. In addition, the design framework is disclosed for extending a one scale filter to a multiscale filter, for designing a filter bank from the multiscale filter and for designing the MAP correlator dependent on the feature being located and the chosen filter bank.


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