The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2000
Filed:
Apr. 17, 1998
Applicant:
Inventor:
Takeshi Konada, Suginami-ku, JP;
Assignee:
Olympus Optical Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250234 ; 250306 ; 250307 ; 73105 ;
Abstract
A near-field scanning microscope is constructed so that a probe is brought close to a specimen and is relatively moved with respect to the surface of said specimen to scan a region proximate to the surface of the specimen and light derived through the probe is detected by a photodetector to thereby measure the optical property of the specimen. This optical microscope is provided with a plurality of probes and a switching mechanism for selecting one of the plurality of probes to place a selected probe close to the specimen. In this way, measurements can be made under different conditions in regard to a particular specimen.