The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2000
Filed:
Feb. 25, 1998
Masataka Mizukoshi, Kawasaki, JP;
Hidehiko Akasaki, Kawasaki, JP;
Masao Nakano, Kawasaki, JP;
Yasuhiro Fujii, Kawasaki, JP;
Shinnosuke Kamata, Kawasaki, JP;
Makoto Yanagisawa, Kawasaki, JP;
Yasurou Matsuzaki, Kawasaki, JP;
Toyonobu Yamada, Kawasaki, JP;
Masami Matsuoka, Kawasaki, JP;
Hiroyoshi Tomita, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A semiconductor wafer testing method includes a pre-test step for forming a temporary test film on a surface of a semiconductor wafer, a test step for testing the semiconductor wafer by applying a probe to the temporary test film and a post-test step for exfoliating the temporary test film from the surface of the semiconductor wafer. The temporary test film includes test electrode groups each provided with a plurality of regularly arranged test electrodes, and wiring patterns for electrically connecting the test electrodes with corresponding ones of semiconductor unit electrodes in respective semiconductor units on the semiconductor wafer. Probe pins of said probe are arranged so as to be aligned with corresponding ones of the test electrodes of the respective test electrode groups.