The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2000

Filed:

Jun. 11, 1997
Applicant:
Inventors:

Joseph Wang, Las Cruces, NM (US);

Xiaohua Cai, Waltham, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
2057775 ; 204403 ;
Abstract

A thick-film sensing apparatus for nucleic acid determination and testing using potentiometric stripping analysis, including two methods for nucleic acid detection at the microfabricated strips, both methods being designed for use with the thick-film sensing apparatus. The present invention is applicable for broad use in nucleic acid analysis, particularly for measurement of nucleic acids (e.g., DNA and RNA), and their sequences and interactions, and for detection of DNA damage, at thick-film electrodes, based on stripping potentiometry.


Find Patent Forward Citations

Wang, Joseph. (2000). Microfabricated thick-film electrochemical sensor for nucleic acid (U.S. Patent No. 6063259). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6063259

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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