The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2000
Filed:
Dec. 07, 1998
Applicant:
Inventor:
Ernst Felix, Uster, CH;
Assignee:
Zellweger Luwa AG, Uster, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73160 ;
Abstract
The invention relates to a method and apparatus for detecting periodic defects in a test material moved longitudinally. In order to enable periodic defects in elongate test material moved longitudinally to be continuously detected with little expenditure, at least two measurements of a parameter which follow one another at a comparatively short interval (W/2) are to be carried out at time intervals (T1, T2 , T3).