The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2000
Filed:
Aug. 25, 1998
Gary R Strong, Waukesha, WI (US);
Bob L Beckett, Wales, WI (US);
Holly A McDaniel, New Berlin, WI (US);
Kathryn M Littlejohn, Wales, WI (US);
Steven M Zanoni, Brookfield, WI (US);
General Electric Company, Milwaukee, WI (US);
Abstract
Methods and apparatus for a multislice graphic Rx display which, in one embodiment, determines a true image location in the Z axis, selects a the correct scan data for image generation, and if a scan is initiated via the GUI or via graphic Rx, determines the affect on the ISO center and DFOV, are described. More particularly, the system determines the offset from the scan plane for each image plane, so that the true image location in Z is displayed. The image offset from the scan plane is a function of the detector row thickness, the number of detector rows, the scan pitch (helical scanning only), the image thickness, and the gantry tilt angle. Further, the image thickness is selected by the user via the GUI, and constrains the image interval which is displayed on the graphic Rx display. Based on image thickness and image interval, the correct scan data is selected so that images are generated at locations exactly matching those shown on the graphic Rx display. Also, if a scan is prescribed either via the GUI or graphic Rx display, the affect on ISO center and DFOV is determined. This information is automatically updated on the graphic Rx display by modifying the cut-line position up/down to show ISO affect and by modifying the cut-line length to show DFOV.