The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2000

Filed:

Jun. 30, 1997
Applicant:
Inventor:

Dennis Corrigan, Plano, TX (US);

Assignee:

Atlantic Richfield Company, Los Angeles, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
367 75 ; 367 51 ;
Abstract

A method and system for correcting seismic survey signals for separating and correcting for the effects of azimuthal anisotropy caused by the overburden, rather than the subsurface reflectivity, is disclosed. Following an initial estimate and normal moveout correction of the traces in a common midpoint gather, analytical traces are generated for coefficient series corresponding to zero-offset travel time response and to the azimuthal anisotropy, over the corrected gather. The quadrature-phase component of the azimuthal anisotropy coefficient series relative to the zero-offset travel time coefficient series indicates the effects of overburden azimuthal anisotropy, while the in-phase component indicates the effects of azimuthal anisotropy from subsurface reflective interfaces. Additional normal moveout correction to correct for the overburden azimuthal anisotropy may then be performed.


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