The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2000
Filed:
Jan. 08, 1997
Tatsuo Igushi, Miyanohigashi-machi, JP;
Yoshiaki Togawa, Miyanohigashi-machi, JP;
Horiba, Ltd., Kyoto, JP;
Abstract
A light scattering particle size distribution measuring apparatus inches a light source for providing a beam of light to contact with a sample cell holding a specimen. A detector assembly includes a first set of detector assembly includes a first set of detector elements for receiving scattered and/or diffracted light from the sample cell and a second set of detector elements positioned between the first set of detector elements. A removable scattering and/or diffracting target member can be positioned on the optical axis to provide a predetermined scattered and/or diffraction pattern to the detector assembly whereby the second set of detector elements can measure the predetermined fraction pattern to enable a movement of one of the light source and the detector assembly to align them on an optical axis.