The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2000

Filed:

Feb. 13, 1998
Applicant:
Inventors:

Takayuki Nabeshima, Kokubunji, JP;

Yasuaki Takada, Kodaira, JP;

Minoru Sakairi, Tokorozawa, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01D / ; H01J / ;
U.S. Cl.
CPC ...
250288 ; 250292 ;
Abstract

In an analytical apparatus, an ion trap mass spectrometer and a detector for detecting ions separated in the mass spectrometer are installed in different chambers. Ions generated from an ion source and passing through two differential pumping chambers into a third chamber containing the detector are deflected from their initial trajectory into the mass spectrometer in a fourth chamber for separation. In a first embodiment, the separated ions are returned along the same path into the detector in the third chamber. According to a second embodiment, the detector is located along the path of ion travel beyond the mass spectrometer, and the separated ions pass through a second orifice in the mass spectrometer and into the detector in the third chamber.


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