The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2000
Filed:
Aug. 04, 1997
Robert K Maloney, Los Angeles, CA (US);
Jeffrey L Stewart, Greenwich, CT (US);
Bruce E Truax, Southington, CT (US);
VisionRx.Com, Inc., Elmsford, NY (US);
Abstract
A technique for evaluating the topography of a cornea in which a virtual object of a keratoscope pattern isured. The topography system includes a structured light source to create the keratoscope pattern or another diagnostic pattern, an optical assembly to focus the created pattern upon or behind the cornea, and for capturing the image reflected off the patient's eye and directing the reflected image toward an imaging system for processing. Light emitted by the light source is preferably not in the visible range, to minimize discomfort to the patient. Since the topography is evaluated with a projected virtual image, there is no nose or brow shadow, thereby allowing better corneal coverage. The optical system includes an aperture stop which is preferably conjugate with a point behind the corneal surface approximating the center of a normal cornea. Thus, wide angle capture is achieved as reflected rays reaching the imaging system appear as if they originated at the center of the cornea. A pupil detection mechanism is disclosed which is performed independently of the diagnostic pattern illumination, thereby facilitating pupil detection. In an alternate embodiment, the diagnostic pattern is generated using a variable light pattern generator, which provides flexibility in selecting target images to achieve various diagnostic abilities. The topography system may be reconfigured to serve as a visual field measuring device, or a perimeter.