The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2000

Filed:

Sep. 09, 1997
Applicant:
Inventors:

Thomas L Hemmelgarn, Vandalia, OH (US);

Frederick K Bell, Centerville, OH (US);

Freddie L Raleigh, Centerville, OH (US);

Donald K Greier, Dayton, OH (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
33503 ;
Abstract

A coordinate measuring machine (CMM) is disclosed having improved manufacturability and low cost while maintaining high performance standards. The CMM includes a polymer composite gantry-style base incorporating a three-point support configuration in the X, Y, and Z axes. The X-beam is hollow, has a horizontal cross-sectional orientation, uses a passive ventilation technique, and is attached to the bearing at one end by a compliant mount. The Z-axis probe shaft incorporates a combined counterbalance/drive assembly and a compliant secondary rail guide mechanism. The X-axis and Y-axis drive screws have angular alignment capability using a spherical washer configuration. This combination of features serves to minimize non-repeatable errors and enhance the manufacturability of the CMM, providing substantial improvements in CMM design and construction.


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