The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2000
Filed:
Aug. 19, 1997
Applicant:
Inventors:
Tilman Jochems, Perpignan, FR;
Veronique Helene Prejean-Lefevre, Sceaux, FR;
Assignee:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382152 ; 382257 ;
Abstract
A process for the automatic detection of defects in a complexe part comprises segmenting a radioscopic image of the part into two classes of zone in such a way as to obtain a binary images referred to as a mask, in which the assessable zones and the non-assessable zones respectively assume the values 1 and 0, and applying to the radioscopic image conditional morphological transformations formulated from a conditional formative element obtained by intersection between a conventional formative element and the mask. The process is particularly applicable to the radioscopic inspection and evaluation of blade castings.