The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2000
Filed:
Apr. 27, 1999
Joseph E Hayden, Spencerport, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
A method and apparatus for testing the configuration of an optical element includes an optical test-set having a holographic optical element designed to obtain a null wave front at the surface of an optical element under test; an interferometer for viewing the test-set, the optical test set and interferometer having optical distortions; and a distortion verification grid (DVG) located in the optical test-set, the DVG comprising a thin opaque sheet of material having a predistorted array of asymmetric holes arranged such that the image of the array of holes formed by the interferometer will be regular and the images of the holes will be symmetric when the optical distortions have been correctly understood and accounted for in the design of the DVG and the distortion correction function.