The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2000
Filed:
Nov. 17, 1997
Stanley M Reich, Jericho, NY (US);
Northrop Grumman Corporation, Los Angeles, CA (US);
Abstract
Absolute strain is measured by providing a coherent beam of light and separating the coherent beam of light into first and second beams which are in quadrature with one another and which have different polarization angles. The first and second beams are combined in a manner which maintains the different polarization angles thereof, so as to form a combined beam. The combined beam is then applied to a Fabry-Perot strain sensor so as to form a reflected combined beam. The reflected combined beam is then separated into first and second reflected beams having different polarization angles. The intensity of the first and second reflected beams is then sensed, so as to determine a change in the etalon length of the Fabry-Perot sensor. The change in etalon length is indicative of the absolute strain sensed.