The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2000
Filed:
Jun. 27, 1997
Norifumi Kobayashi, Yokohama, JP;
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Abstract
A delay element testing apparatus has a signal generator for generating a plurality of signals, at least one of which is variable in timing; a phase comparator for making a comparison of a relationship in terms of phasic anteriority and posteriority between the signal passing through a delay element under test and the timing-variable signal among the plurality of signals; and a test result output circuit, controlled by a control signal generated by the phase comparator, for outputting a signal indicating a quality of a delay characteristic of the delay element under test. Main parts of this testing apparatus can be provided on a substrate to realize an integrated having a function for testing delay elements included therein.