The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2000

Filed:

Apr. 27, 1998
Applicant:
Inventors:

Michael LeBlanc, Austin, TX (US);

Davoud Safari, Round Rock, TX (US);

Edwin Smith, Leander, TX (US);

Assignee:

Compaq Computer Corporation, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
714718 ; 714717 ; 714719 ; 365200 ; 365201 ;
Abstract

The gangSIMM Memory Tester is a PWA which plugs directly into a CPU's SIMM slot. The gangSIMM Memory Tester contains a known good SIMM, which is connected directly to the CPU's bus. All memory functions for this SIMM slot is provided by the gold SIMM per normal SIMM operation. The CPU bus routed to the gold SIMM on the gangSIMM Memory Tester is also routed to a test bus via a buffer which provides increased drive capacity. The test bus is distributed in parallel to N number of SIMM slots located on the gangSIMM Memory Tester throughout a second set of tri-stating buffers. During read accesses to memory involving the CPUs SIMM slot location where the gangSIMM PWA is directly plugged into, data provided by the gold SIMM is compared on an individual basis with the data provided by an under-test SIMM. This operation occurs in-parallel for all under-test SIMMs.


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