The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2000

Filed:

Jan. 29, 1998
Applicant:
Inventors:

Alain Ries, Jouy-en-Josas, FR;

Loic Mathieu, Cachan, FR;

Manuel Stopnicki, Paris, FR;

Assignee:

Infovista S.A., Villebon sur Yvette, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
702186 ; 39520054 ;
Abstract

Process for measuring performance and monitoring service quality of an information system, this process comprising a process for acquiring data within the information system, a process for processing the data and calculating Indicators, and a supply of reports on the performance and/or the service quality within this information system. It further comprises a process for homogenizing acquired data originating from various data sources, in particular: 1) data acquired by real-time polling; 2) data, in particular continuous or discrete data or events, acquired in real time from an external source; and 3) data, in particular continuous or discrete data or events, acquired in deferred time from an external source.


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