The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2000
Filed:
Jul. 16, 1997
Franz Bolduan, Mannheim, DE;
Bernd Eisenbarth, Mannheim, DE;
Karl Miltner, Frankenthal, DE;
Helmut Leininger, Mannheim, DE;
Detlef Thym, Mannheim, DE;
Boehringer Mannheim GmbH, Mannheim, DE;
Abstract
Analytical system for evaluating test elements having means of determining whether a sufficient amount of sample liquid was evenly applied to an application zone comprising in a first embodiment of the invention at least two sources of light which illuminate separate or at least not fully overlapping areas of the application zone or the evaluation zone of the test strip, a control unit with which the light sources, of which there at least two, can be independently activated, at least one sensor which detects light reflected by the evaluation zone or transmitted by the evaluation zone and supplies an output signal proportional to the intensity of light as well as an evaluation unit which receives a first output signal from the sensor and converts it into a first measured value when the first of the light sources is activated, receives a second output signal from the sensor and converts it into a second measured value when the second of the light sources, is activated and compares the measured values and determines whether the deviation of the first value measured from the second value measured is sufficiently small. In a second embodiment of an analytical system according to the invention, at least one light source is used to illuminate the sample application zone or the evaluation zone of a test element and at least two sensors detect light reflected or transmitted by the evaluation zone, the output signal of the sensors being converted into measured values by the evaluation unit which determines whether the deviation of the measured values is sufficiently small.