The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2000
Filed:
Feb. 02, 1996
Masunori Kawamura, Nagoya, JP;
Setsuo Saitou, Aichi, JP;
Nidek Company, Ltd., , JP;
Abstract
An ophthalmic measuring apparatus in one aspect of the invention for examining the crystalline lens of an eye having a measuring unit which projects a measuring light beam on the crystalline lens of the eye and receives the measuring light scattered by the crystalline lens comprises: a reference position setting means for setting a reference position for the eye in a three-dimensional space; a moving means for moving the measuring unit in a three-dimensional space relative to the eye; and a displacement detecting means for detecting the displacement of the measuring unit from the reference position for the eye. An ophthalmic measuring apparatus in another aspect of the invention, which irradiates the eyeball of an eye with a collimated beam of laser light and guides the laser light scattered by molecules of the crystalline lens of the eye through a light receiving optical system to a photoelectric transducer, comprises an observation optical system for observing the front of the eye, and a magnification changing means for changing the observation magnification of the observation optical system.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile