The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2000

Filed:

Jun. 03, 1998
Applicant:
Inventors:

Seiji Muranaka, Tokyo, JP;

Kuniaki Miyake, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
7386312 ; 7386331 ;
Abstract

An organic substance analyzing system identifies and quantifies organic substances adhering to the surface of a sample placed in a chamber for a local organic substance analysis on the surface of the sample. The organic substance analyzing system heats a portion of the sample from the front side or the back side of the sample, collects gases discharged out of the portion of the surface and analyzes the collected gases. A lamp, a laser or an electron beam source is used as a heating means for locally heating a portion to be analyzed on the surface of the sample to locally discharge the gases out of the portion. Otherwise, the entire surface of the sample is heated, and the discharged gases are collected for every section so as to be analyzed.


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