The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2000

Filed:

Feb. 03, 1997
Applicant:
Inventors:

Susan R Nelson, Panama City, FL (US);

Susan M Tuovila, Panama City, FL (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382225 ; 382275 ; 382291 ;
Abstract

A method is presented for identifying clutter in an image such as a sonar age. A detection scheme identifies portions of the image having a signal-to-noise ratio greater than a given threshold. A classification scheme is then applied to each such portion to generate fractal feature values associated therewith in order to classify the portion as a target or non-target. For clutter identification, each portion is assigned to a group based on a distance from the position of each portion to another of the portions that is its nearest neighbor. A series of tests are then performed for each group using the fractal feature values associated with each portion in each group. A failure of any of the series of tests by a group identifies each portion associated with that group as clutter in the image.


Find Patent Forward Citations

Nelson, Susan. (2000). Fractal features used with nearest neighbor clustering for identifying (U.S. Patent No. 6052485). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6052485

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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