The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2000
Filed:
Feb. 19, 1998
Yong-Sheng Chao, Storrs, CT (US);
Advanced Optical Technologies, Inc., E. Hartford, CT (US);
Abstract
Apparatus and method for performing dual-energy x-ray imaging using two-dimensional detectors. The apparatus consists of, in physical order, an x-ray source, a front two-dimensional x-ray detector, a beam selector, and a rear two-dimensional x-ray detector. The subject is located between the x-ray source and front detector. The beam selector prevents primary x-rays from reaching selected locations of the rear detector. A pair of primary dual-energy images is obtained at the rear detector. Using a dual-energy data decomposition method, a low-resolution primary x-ray front detector image is calculated, from which a high-resolution primary dual-energy image pair is calculated. In addition, the data decomposition method can be used to calculate a pair of high-spatial-resolution material composition images.