The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2000
Filed:
Oct. 13, 1998
Thomas H Brayden, Jr, Irving, TX (US);
Thomas D Winters, Jr, Arlington, TX (US);
Northrop Grumman Corporation, Los Angeles, CA (US);
Abstract
A coating thickness measurement system (10) for measuring a thickness of a coating (12) on a coated substrate (14) is provided. The coating thickness measurement system (10) may comprise a light source (16), a detector system (18), and a processor (20). The light source (16) directs a light beam (22) at an angle (26) oblique to an axis (28) of the coating (12). The light beam (22) striking the coating (12) produces a reflected light beam (36). The detector system (18) measures a reflectivity of the coating (12). The processor (20) receives the reflectivity measurement and determines the reflectivity of the coating (12). The thickness of the coating (12) is determined from the reflectivity of the coating (12).