The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2000

Filed:

Oct. 23, 1997
Applicant:
Inventors:

Akira Tanaka, Tokyo, JP;

Keiji Nunomura, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G / ;
U.S. Cl.
CPC ...
345147 ; 345 89 ; 345148 ;
Abstract

A sub-field array is formed by providing a sub-field corresponding to an m-th bit sub-field (m and n being a positive integers of m.ltoreq.n and representing the most significant bit place when m is 1) bit substantially at the center of the time axis of all the sub-field periods, and providing the other sub-fields than the m-th significant one on the opposite sides of and substantially in line symmetry with respect to the m-th significant bit sub-field. Less significant bit sub-fields are provided on the opposite sides of the close proximity of the central sub-field in the field period, and the odd and even order sub-fields are arranged in opposite sequences from one another. As the symmetrical arrangement sub-fields, odd and even scan line sub-fields are provided on the opposite sides of the central sub-field.


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